2024.12

AL Spin Etcher Flow Monitoring and Process Interlock Upgrade

Added non-contact flow monitoring to an AL spin etcher and upgraded its interlocks so persistent abnormal flow inhibits new processing while allowing an in-process wafer to rinse and unload safely.

Clamp-on Flow MonitoringPLC InterlockProcess InhibitRetrofit
AL Spin Etcher Flow Monitoring and Process Interlock Upgrade field photo

Work Performed

Field challenge

The existing tool had no sensor for actual supply flow. Operators could only check chemical pressure on an analog gauge or rely on low/high alarms. Actual flow in the metal-etchant, DI water/rinse and N2/air-knife lines was therefore not visible on the operator screen, and a supply abnormality could affect the etching process. Existing tubing and piping also had to remain as unchanged as possible.

Work / Solution

KEYENCE clamp-on flow sensors were installed on the chemical and N2 tubing without cutting the lines. JUNSEMI completed the sensor installation, electrical work, wiring, PLC modifications and touch-panel updates, displaying real-time flow by circuit and linking the measurements to alarms and process interlocks. A watchdog delay issues an alarm only when abnormal flow continues beyond the configured time, filtering brief fluctuation and hunting. When an abnormal condition persists, new process starts are inhibited; a wafer already in process is allowed to rinse and unload through a controlled safe-completion sequence. Operators can configure the flow threshold, delay time and interlock enable setting from the touch panel.

Key functions and engineering

• Flow monitoring for metal etchant, DI water/rinse and N2/air-knife lines

• KEYENCE non-contact clamp-on flow sensors

• Retrofit installation with no tubing cut on the monitored lines

• Sensor wiring, PLC input handling and process-interlock integration

• Watchdog-based persistence check and hunting suppression

• Abnormal-flow alarm and new-process inhibit

• Rinse and unload sequence for a wafer already in process

• Touch-panel settings for threshold, delay and interlock enable

Verified Result

Verified real-time flow display, time-qualified alarms, new-process inhibition, rinse-and-unload handling for an in-process wafer and the operator settings together with the customer. No numerical defect-reduction rate is claimed because quantified data was not available.

Field Photos

Start with the equipment model and current symptom.

Send the equipment or controller model, current issue and preferred schedule. We will reply with the information needed to define the work scope.

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